Fast Surface Profiling by Multi-Wavelength Single-Shot...

International Journal of Optomechatronics 2010 / 05 Vol. 4; Iss. 2

Fast Surface Profiling by Multi-Wavelength Single-Shot Interferometry

Kitagawa, Katsuichi
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Volume:
4
Language:
english
Journal:
International Journal of Optomechatronics
DOI:
10.1080/15599612.2010.484522
Date:
May, 2010
File:
PDF, 1.66 MB
english, 2010
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