An uncertainty analysis for the measurement of microwave...

IEEE Transactions on Instrumentation and Measurement 1986 / 03 Vol. IM-35; Iss. 1

An uncertainty analysis for the measurement of microwave conductivity and dielectric constant by the short-circuited line method

Chao, Shuh-Han
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Volume:
IM-35
Language:
english
Journal:
IEEE Transactions on Instrumentation and Measurement
DOI:
10.1109/tim.1986.6499053
Date:
March, 1986
File:
PDF, 845 KB
english, 1986
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