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[IEEE 2011 IEEE 17th International Symposium for Design and Technology in Electronic Packaging (SIITME) - Timisoara, Romania (2011.10.20-2011.10.23)] 2011 IEEE 17th International Symposium for Design and Technology in Electronic Packaging (SIITME) - Lifetime prediction for components with scarce data: The “worst case” approach
Bazu, M., Galateanu, L., Ilian, V. E., Varsescu, D.Year:
2011
Language:
english
DOI:
10.1109/siitme.2011.6102742
File:
PDF, 542 KB
english, 2011