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[IEEE 2013 International Semiconductor Conference Dresden - Grenoble (ISCDG) - Dresden, Germany (2013.09.26-2013.09.27)] 2013 International Semiconductor Conference Dresden - Grenoble (ISCDG) - Analysis and optimization of program disturb in split-gate cells using source side injection and impact on further cell size reduction
Bukethal, Christoph, Tempel, Georg, Strenz, Robert, Power, JohnYear:
2013
Language:
english
DOI:
10.1109/iscdg.2013.6656317
File:
PDF, 722 KB
english, 2013