Efficient Spatial Pattern Analysis for Variation...

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 2013 / 7 Vol. 32; Iss. 7

Efficient Spatial Pattern Analysis for Variation Decomposition Via Robust Sparse Regression

Wangyang Zhang,, Balakrishnan, K., Xin Li,, Boning, D. S., Saxena, S., Strojwas, A., Rutenbar, R. A.
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Volume:
32
Language:
english
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI:
10.1109/tcad.2013.2245942
Date:
July, 2013
File:
PDF, 643 KB
english, 2013
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