[IEEE 2011 NORCHIP - Lund, Sweden (2011.11.14-2011.11.15)]...

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[IEEE 2011 NORCHIP - Lund, Sweden (2011.11.14-2011.11.15)] 2011 NORCHIP - Measurement of a system-adaptive error-detection sequential circuit with subthreshold SCL

Turnquist, Matthew J., Laulainen, Erkka, Makipaa, Jani, Koskinen, Lauri
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Year:
2011
Language:
english
DOI:
10.1109/norchp.2011.6126746
File:
PDF, 1.57 MB
english, 2011
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