[IEEE 2013 IEEE/MTT-S International Microwave Symposium - MTT 2013 - Seattle, WA, USA (2013.06.2-2013.06.7)] 2013 IEEE MTT-S International Microwave Symposium Digest (MTT) - On-chip demonstration of real time spectrum analysis (RTSA) using integrated dispersive delay line (IDDL)
Xiang, Bo, Wang, Xiao, Apsel, Alyssa B.Year:
2013
Language:
english
DOI:
10.1109/mwsym.2013.6697467
File:
PDF, 283 KB
english, 2013