[IEEE 2008 IEEE Custom Integrated Circuits Conference - CICC 2008 - San Jose, CA, USA (2008.09.21-2008.09.24)] 2008 IEEE Custom Integrated Circuits Conference - Early prediction of product performance and yield via technology benchmark
Cho, Choongyeun, Kim, Daeik D., Kim, Jonghae, Lim, Daihyun, Cho, SangyeunYear:
2008
Language:
english
DOI:
10.1109/cicc.2008.4672059
File:
PDF, 316 KB
english, 2008