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[IEEE 2007 IEEE/ACM International Conference on Computer-Aided Design - San Jose, CA, USA (2007.11.4-2007.11.8)] 2007 IEEE/ACM International Conference on Computer-Aided Design - Estimation of delay test quality and its application to test generation

Seiji Kajihara,, Shohei Morishima,, Masahiro Yamamoto,, Xiaoqing Wen,, Masayasu Fukunaga,, Kazumi Hatayama,, Takashi Aikyo,
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Year:
2007
Language:
english
DOI:
10.1109/iccad.2007.4397300
File:
PDF, 947 KB
english, 2007
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