![](/img/cover-not-exists.png)
[IEEE Comput. Soc Proceedings. International Workshop on Memory Technology, Design and Testing (Cat. NO.97TB100159) - San Jose, CA, USA (11-12 Aug. 1997)] Proceedings. International Workshop on Memory Technology, Design and Testing (Cat. NO.97TB100159) - A low cost, high performance three-dimensional memory module technology
Glaser, A., Nakkar, M., Franzon, P., Rinne, G., Roberson, M., Rogers, V., Williams, C.K.Year:
1997
Language:
english
DOI:
10.1109/mtdt.1997.619387
File:
PDF, 462 KB
english, 1997