Discussion

Technometrics 1998 / 08 Vol. 40; Iss. 3

Discussion

Meyer, R. Daniel, Trost, Donald C., Vukovinsky, Kimberly E.
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Volume:
40
Language:
english
Journal:
Technometrics
DOI:
10.1080/00401706.1998.10485518
Date:
August, 1998
File:
PDF, 448 KB
english, 1998
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