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[IEEE 2010 IEEE International Conference on Imaging Systems and Techniques (IST) - Thessaloniki, Greece (2010.07.1-2010.07.2)] 2010 IEEE International Conference on Imaging Systems and Techniques - 3D inspection of fabrication and degradation processes from X-ray (micro) tomography images using a hole closing algorithm
Babout, L., Janaszewski, M., Bakavos, D., McDonald, S.A., Prangnell, P.B, Marrow, T.J., Withers, P.J.Year:
2010
Language:
english
DOI:
10.1109/ist.2010.5548537
File:
PDF, 968 KB
english, 2010