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[IEEE Comput. Soc 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Albuquerque, NM, USA (1-3 Nov. 1999)] Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99) - Failure tests on 64 Mb SDRAM in radiation environment
Bertazzoni, S., Cardarilli, G.C., Piergentili, D., Salmeri, M., Salsano, A., Di Giovenale, D., Grande, G.C., Marinucci, P., Sperandei, S., Bartalucci, S., Massenga, G., Ricci, M., Bidoli, V., De FrancYear:
1999
Language:
english
DOI:
10.1109/dftvs.1999.802881
File:
PDF, 72 KB
english, 1999