[IEEE Design, Automation & Test in Europe Conference - Nice, France (2007.04.16-2007.04.20)] 2007 Design, Automation & Test in Europe Conference & Exhibition - Very Wide Register: An Asymmetric Register File Organization for Low Power Embedded Processors
Raghavan, Praveen, Lambrechts, Andy, Jayapala, Murali, Catthoor, Francky, Verkest, Diederik, Corporaal, HenkYear:
2007
Language:
english
DOI:
10.1109/date.2007.364435
File:
PDF, 184 KB
english, 2007