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[IEEE 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Vancouver, BC, Canada (2011.10.3-2011.10.5)] 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems - Spatial and Temporal Data Path Remapping for Fault-Tolerant Coarse-Grained Reconfigurable Architectures
Eisenhardt, Sven, Küster, Anja, Schweizer, Thomas, Kuhn, Tommy, Rosenstiel, WolfgangYear:
2011
Language:
english
DOI:
10.1109/dft.2011.7
File:
PDF, 370 KB
english, 2011