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[IEEE 2014 IEEE Symposium on VLSI Circuits - Honolulu, HI, USA (2014.6.10-2014.6.13)] 2014 Symposium on VLSI Circuits Digest of Technical Papers - Early detection and repair of VRT and aging DRAM bits by margined in-field BIST
Kleveland, Bendik, Jeong Choi,, Kumala, Jeff, Adam, Pascal, Chen, Patrick, Chopra, Rajesh, Cruz, Antonio, David, Ronald, Dixit, Ashish, Doluca, Sinan, Hendrickson, Mark, Lee, Ben, Ming Liu,, Miller,Year:
2014
Language:
english
DOI:
10.1109/vlsic.2014.6858414
File:
PDF, 828 KB
english, 2014