[IEEE 2013 IEEE 19th International On-Line Testing...

  • Main
  • [IEEE 2013 IEEE 19th International...

[IEEE 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - Chania (2013.7.8-2013.7.10)] 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - When processors get old: Evaluation of BTI and HCI effects on performance and reliability

Sandionigi, Chiara, Heron, Olivier, Bertolini, Clement, David, Raphael
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2013
Language:
english
DOI:
10.1109/iolts.2013.6604076
File:
PDF, 227 KB
english, 2013
Conversion to is in progress
Conversion to is failed