[IEEE 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - Chania (2013.7.8-2013.7.10)] 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - When processors get old: Evaluation of BTI and HCI effects on performance and reliability
Sandionigi, Chiara, Heron, Olivier, Bertolini, Clement, David, RaphaelYear:
2013
Language:
english
DOI:
10.1109/iolts.2013.6604076
File:
PDF, 227 KB
english, 2013