Unified Compact Model of Soft Breakdown Oxide Degradation and Its Impact on CMOS Circuits Reliability
Gerrer, Louis, Ghibaudo, Gérard, Rafik, MustaphaVolume:
12
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2011.2181174
Date:
March, 2012
File:
PDF, 333 KB
english, 2012