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[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Measurement of neutron-induced single event transient pulse width narrower than 100ps
Nakamura, Hideyuki, Tanaka, Katsuhiko, Uemura, Taiki, Takeuchi, Kan, Fukuda, Toshikazu, Kumashiro, ShigetakaYear:
2010
Language:
english
DOI:
10.1109/irps.2010.5488749
File:
PDF, 308 KB
english, 2010