[IEEE Conference Record of the 2004 IEEE International Symposium on Electrical Insulation - Indianapolis, IN, USA (19-22 Sept. 2004)] Conference Record of the 2004 IEEE International Symposium on Electrical Insulation - Electroluminescence test to evaluate dielectric property at the interface between semiconductive shield and insulation
Han, S.J., Gross, L.H.Year:
2004
Language:
english
DOI:
10.1109/elinsl.2004.1380675
File:
PDF, 284 KB
english, 2004