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[IEEE ESSDERC 2010 - 40th European Solid State Device Research Conference - Sevilla, Spain (2010.09.14-2010.09.16)] 2010 Proceedings of the European Solid State Device Research Conference - Temperature dependent dielectric absorption characterization and modeling for SiN, Al2O3 and Ta2O5
Muminovic, H., Riess, P., Baumgartner, P., Klein, P.Year:
2010
Language:
english
DOI:
10.1109/essderc.2010.5618355
File:
PDF, 1.67 MB
english, 2010