[IEEE 2010 5th IEEE Conference on Industrial Electronics and Applications (ICIEA) - Taichung, Taiwan (2010.06.15-2010.06.17)] 2010 5th IEEE Conference on Industrial Electronics and Applications - Optical design and signal processing for a microcrack detection system
Wen-Ren Yang,, Yu-Lin Li,Year:
2010
Language:
english
DOI:
10.1109/iciea.2010.5515329
File:
PDF, 610 KB
english, 2010