[IEEE 2007 IEEE International Conference on Signal Processing and Communications - Dubai, United Arab Emirates (2007.11.24-2007.11.27)] 2007 IEEE International Conference on Signal Processing and Communications - Defect Deconvolution using 4th Order Statistics for Ultrasonic Nondestructive Testing
Qidwai, Uvais, Bettayeb, Maamar, Yamani, AhmedYear:
2007
Language:
english
DOI:
10.1109/icspc.2007.4728398
File:
PDF, 1.17 MB
english, 2007