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[IEEE 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2010) - Singapore, Singapore (2010.07.5-2010.07.9)] 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - In-situ polyimide removal using modified dual acid decapsulator
Ramachandra, C., Sarat Kumar Dash,, Ravindra, M., Khan, A.M., Sweety, B.M., Chandan, U.G., Jaypal, D.Year:
2010
Language:
english
DOI:
10.1109/ipfa.2010.5531986
File:
PDF, 950 KB
english, 2010