[IEEE International Electron Devices Meeting 1991 [Technical Digest] - Washington, DC, USA (8-11 Dec. 1991)] International Electron Devices Meeting 1991 [Technical Digest] - Extraction of the series resistances and effective channel length of GaAs MESFETs by means of electrical methods: a numerical study
Menozzi, R., Selmi, L., Gandolfi, P., Ricco, B.Year:
1991
Language:
english
DOI:
10.1109/iedm.1991.235383
File:
PDF, 317 KB
english, 1991