[IEEE 2002 International Test Conference - Baltimore, MD, USA (7-10 Oct. 2002)] Proceedings. International Test Conference - Testing highly integrated wireless circuits and systems with low cost tester: how to overcome the challenge?
Slamani, M.Year:
2002
Language:
english
DOI:
10.1109/test.2002.1041927
File:
PDF, 50 KB
english, 2002