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[IEEE 2006 25th International Conference on Microelectronics - Belgrade, Serbia and Montenegro (14-17 May 2006)] 2006 25th International Conference on Microelectronics - Long Range Statistical Lifetime Prediction of UltraThin SiO2 Oxides: Influence of Accelerated Ageing Methods and Extrapolation Models
Pic, D., Goguenheim, D., Ogier, J.-L.Year:
2006
Language:
english
DOI:
10.1109/icmel.2006.1651019
File:
PDF, 717 KB
english, 2006