[IEEE 2006 IEEE Autotestcon - Anaheim, CA, USA (2006.09.18-2006.09.21)] 2006 IEEE Autotestcon - Instrument Modular Design Based on LXI Bus
Gu, Jun, Zhan, HuiqinYear:
2006
Language:
english
DOI:
10.1109/autest.2006.283663
File:
PDF, 4.01 MB
english, 2006