[IEEE 2000 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (23-26 Oct. 2000)] 2000 IEEE International Integrated Reliability Workshop Final Report (Cat. No.00TH8515) - LSF technique to analyze intrinsic TDDB failures of gate oxides
Katto, H.Year:
2000
Language:
english
DOI:
10.1109/irws.2000.911919
File:
PDF, 383 KB
english, 2000