Simulation of a QMS Including the Effects of Pressure in...

Simulation of a QMS Including the Effects of Pressure in the Electron-Impact Ion Source

Sreekumar, Jeyan, Hogan, Thomas J., Taylor, Stephen
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Volume:
61
Language:
english
Journal:
IEEE Transactions on Instrumentation and Measurement
DOI:
10.1109/tim.2012.2202166
Date:
November, 2012
File:
PDF, 663 KB
english, 2012
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