![](/img/cover-not-exists.png)
Simulation of a QMS Including the Effects of Pressure in the Electron-Impact Ion Source
Sreekumar, Jeyan, Hogan, Thomas J., Taylor, StephenVolume:
61
Language:
english
Journal:
IEEE Transactions on Instrumentation and Measurement
DOI:
10.1109/tim.2012.2202166
Date:
November, 2012
File:
PDF, 663 KB
english, 2012