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[IEEE 2010 Seventh International Conference on Information Technology: New Generations - Las Vegas, NV, USA (2010.04.12-2010.04.14)] 2010 Seventh International Conference on Information Technology: New Generations - An Empirical Study of Pairwise Test Set Generation Using a Genetic Algorithm
McCaffrey, James D.Year:
2010
Language:
english
DOI:
10.1109/itng.2010.93
File:
PDF, 540 KB
english, 2010