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[IEEE 2008 IEEE International Reliability Physics Symposium (IRPS) - Phoenix, AZ, USA (2008.04.27-2008.05.1)] 2008 IEEE International Reliability Physics Symposium - A scalable SCR compact model for ESD circuit simulation
Di Sarro, James, Rosenbaum, ElyseYear:
2008
Language:
english
DOI:
10.1109/relphy.2008.4558895
File:
PDF, 395 KB
english, 2008