[IEEE 2006 IEEE International Test Conference - Santa Clara, CA, USA (2006.10.22-2006.10.27)] 2006 IEEE International Test Conference - Embedded Memory Diagnosis: An Industrial Workflow
Appello, Davide, Tancorre, Vincenzo, Bernardi, Paolo, Grosso, Michelangelo, Rebaudengo, Maurizio, Reorda, MatteoYear:
2006
Language:
english
DOI:
10.1109/test.2006.297672
File:
PDF, 365 KB
english, 2006