Fast Estimation of Timing Yield Bounds for Process...

IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2008 / 03 Vol. 16; Iss. 3

Fast Estimation of Timing Yield Bounds for Process Variations

Chen, Ruiming, Zhou, Hai
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Volume:
16
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/tvlsi.2007.915398
Date:
March, 2008
File:
PDF, 450 KB
english, 2008
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