[IEEE 2011 IEEE Conference on Visual Analytics Science and Technology (VAST) - Providence, RI, USA (2011.10.23-2011.10.28)] 2011 IEEE Conference on Visual Analytics Science and Technology (VAST) - Observation-level interaction with statistical models for visual analytics
Endert, Alex, Han, Chao, Maiti, Dipayan, House, Leanna, Leman, Scotland, North, ChrisYear:
2011
Language:
english
DOI:
10.1109/vast.2011.6102449
File:
PDF, 1.25 MB
english, 2011