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[IEEE 2010 IEEE International Conference on Automation Science and Engineering (CASE 2010) - Toronto, ON (2010.08.21-2010.08.24)] 2010 IEEE International Conference on Automation Science and Engineering - Particle filtering of hidden Gamma processes for robust Predictive Maintenance in semiconductor manufacturing

Schirru, Andrea, Pampuri, Simone, De Nicolao, Giuseppe
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Year:
2010
Language:
english
DOI:
10.1109/coase.2010.5584518
File:
PDF, 1.15 MB
english, 2010
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