[IEEE 17th International Zurich Symposium on Electromagnetic Compatibility - Singapore (2006.02.27-2006.03.3)] 2006 17th International Zurich Symposium on Electromagnetic Compatibility - Analyses of several realistic exposure scenarios near cellular base stations
Zaridze, R., Kakulia, D., Kajaia, G., Mazmanov, D., Manukyan, L., Jejelava, N., Gogua, T.Year:
2006
Language:
english
DOI:
10.1109/emczur.2006.214923
File:
PDF, 793 KB
english, 2006