Investigation of Modeling System ESD Failure and...

IEEE Transactions on Device and Materials Reliability 2012 / 12 Vol. 12; Iss. 4

Investigation of Modeling System ESD Failure and Probability Using IBIS ESD Models

Monnereau, N., Caignet, F., Nolhier, N., Bafleur, M., Tremouilles, D.
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Volume:
12
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2012.2218605
Date:
December, 2012
File:
PDF, 1.53 MB
english, 2012
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