[IEEE International Workshop on Numerical Modeling of processes and Devices for Integrated Circuits: NUPAD V - Honolulu, HI, USA (5-6 June 1994)] Proceedings of International Workshop on Numerical Modeling of processes and Devices for Integrated Circuits: NUPAD V - Semi-empirical local NMOS mobility model for 2-D device simulation incorporating screened minority impurity scattering
Mujtaba, S.A., Dutton, R.W., Scharfetter, D.L.Year:
1994
Language:
english
DOI:
10.1109/nupad.1994.343504
File:
PDF, 287 KB
english, 1994