[IEEE 2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis - Chengdu , China (2009.04.28-2009.04.29)] 2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis - VSPTIDR: A Novel Code for Test Compression of SoC
Cui, Xiaole, Yin, Liang, Hong, Jinxi, Zuo, Renfu, Cui, Xiaoxin, Chen, WeiYear:
2009
Language:
english
DOI:
10.1109/cas-ictd.2009.4960908
File:
PDF, 242 KB
english, 2009