[IEEE 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Shanghai, China (2010.11.1-2010.11.4)] 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology - A research on the fast correlation-based background calibration techniques for the pipeline ADCs
Liang, Shang-Quan, Yin, Yong-Sheng, Deng, Hong-Hui, Zhang, Rui, Hu, JunYear:
2010
Language:
english
DOI:
10.1109/icsict.2010.5667685
File:
PDF, 365 KB
english, 2010