[IEEE 2011 IEEE Pulsed Power Conference (PPC) - Chicago, IL, USA (2011.06.19-2011.06.23)] 2011 IEEE Pulsed Power Conference - Test for end connection integrity of metalized film capacitors
Qin, Shanshan, Qi, Xiaoguang, Jow, Richard, Boggs, StevenYear:
2011
Language:
english
DOI:
10.1109/ppc.2011.6191563
File:
PDF, 1.32 MB
english, 2011