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[IEEE International Test Conference 2004 - Charlotte, NC, USA (26-28 Oct. 2004)] 2004 International Conferce on Test - Speed clustering of integrated circuits
Brand, K.A., Mitra, S., Volkerink, E., McCluskey, E.J.Year:
2004
Language:
english
DOI:
10.1109/test.2004.1387387
File:
PDF, 692 KB
english, 2004