[IEEE 2009 International Conference on Innovations in Information Technology (IIT) - Al-Ain, United Arab Emirates (2009.12.15-2009.12.17)] 2009 International Conference on Innovations in Information Technology (IIT) - Analysis of single-event effects in embedded processors for non-uniform fault tolerant design
Firouzi, Farshad, Salehi, Mostafa E., Azarpeyvand, Ali, Fakhraie, Sied Mehdi, Safari, SaeedYear:
2009
Language:
english
DOI:
10.1109/iit.2009.5413372
File:
PDF, 327 KB
english, 2009