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1.5 MeV proton irradiation effects on electrical and structural properties of TiO2/n-Si interface
Ishfaq, M., Rizwan Khan, M., Bhopal, M. F., Nasim, F., Ali, A., Bhatti, A. S., Ahmed, I., Bhardwaj, Sunil, Cepek, CinziaVolume:
115
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4874942
Date:
May, 2014
File:
PDF, 1.81 MB
english, 2014