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[IEEE 2010 15th IEEE European Test Symposium (ETS) - Praha, Czech Republic (2010.05.24-2010.05.28)] 2010 15th IEEE European Test Symposium - A shared BIST optimization methodology for memory test
Zaourar, Lilia, Chentoufi, Jihane Alami, Kieffer, Yann, Wenzel, Arnaud, Grandvaux, FredericYear:
2010
DOI:
10.1109/etsym.2010.5512736
File:
PDF, 143 KB
2010