[IEEE 2013 12th International Conference on Document...

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[IEEE 2013 12th International Conference on Document Analysis and Recognition (ICDAR) - Washington, DC, USA (2013.08.25-2013.08.28)] 2013 12th International Conference on Document Analysis and Recognition - Robust Symbol Localization Based on Junction Features and Efficient Geometry Consistency Checking

Pham, The Anh, Delalandre, Mathieu, Barrat, Sabine, Ramel, Jean-Yves
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Year:
2013
Language:
english
DOI:
10.1109/icdar.2013.216
File:
PDF, 388 KB
english, 2013
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