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[IEEE 2011 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2011.09.20-2011.09.22)] 2011 IEEE International Test Conference - Actual implementation of multi domain test: Further reduction of cost of test
Takahashi, Yasuhiro, Maeda, Akinori, Ogura, MitsuhiroYear:
2011
Language:
english
DOI:
10.1109/test.2011.6139135
File:
PDF, 371 KB
english, 2011