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[IEEE 2006 25th International Conference on Microelectronics - Belgrade, Serbia and Montenegro (14-17 May 2006)] 2006 25th International Conference on Microelectronics - Investigation of the Novel Attributes of a Vertical MOSFET with Internal Block Layer (bVMOS): 2-D Simulation Study
Jyi-Tsong Lin,, Kao-Cheng Lin,, Tai-Yi Lee,, Yi-Chuen Eng,Year:
2006
Language:
english
DOI:
10.1109/icmel.2006.1651008
File:
PDF, 707 KB
english, 2006