[IEEE 2005 IEEE International SOI - Honolulu, HI, USA...

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[IEEE 2005 IEEE International SOI - Honolulu, HI, USA (03-06 Oct. 2005)] 2005 IEEE International SOI Conference Proceedings - Fin Thickness Asymmetry Effects in Multiple-Gate SOI FETs (MuGFETs)

Schulz, T., Xiong, W., Cleavelin, C.R., Schruefer, K., Gostkowski, M., Matthews, K., Gebara, G., Zaman, R.J., Patruno, P., Chaudhry, A., Woo, A., Colinge, J.P.
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Year:
2005
Language:
english
DOI:
10.1109/soi.2005.1563571
File:
PDF, 1.57 MB
english, 2005
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